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Resultados para Editorial: Wiley (21 a 30 de más de 200)
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Título | Advanced Plasma Technology | Precio | $3984.00 |
| Autor | Agostino, R. D': P. Favia; Y. Kawai; H. Ikegami; N. Sato; An | Año | 2008 | |
| Editorial | Wiley | Edición | 1ª | |
| Tema | ISBN | 9783527405916 |
|
Título | Narketing Research | Precio | $1050.00 |
| Autor | Aaker/ Kumar/ Day | Año | ||
| Editorial | Wiley | Edición | 1ª | |
| Tema | ISBN | 9780470050767 |
|
Título | Nonlinear Phenomena In Power Electronics | Precio | $3499.00 |
| Autor | Banerjee, Soumitro; Verghese, George C. | Año | 2001 | |
| Editorial | Wiley | Edición | 1ª | |
| Tema | ISBN | 9780780353831 |
|
Título | 9/11 Culture | Precio | $432.00 |
| Autor | Melnick, Jeffrey | Año | 2009 | |
| Editorial | Wiley | Edición | 1ª | |
| Tema | ISBN | 9781405173711 |
 |
Título | Cultural Studies: A Practical Introduction | Precio | $391.50 |
| Autor | Ryan, Michael | Año | 2010 | |
| Editorial | Wiley | Edición | 1ª | |
| Tema | ISBN | 9781405170499 |
|
Título | Classic Problems Of Probability | Precio | $960.00 |
| Autor | Gorroochurn, Prakash | Año | 2012 | |
| Editorial | Wiley | Edición | 1ª | |
| Tema | ISBN | 9781118063255 |
|
Título | Ordinary Differential Equations | Precio | $1734.00 |
| Autor | Greenberg, Michael D. | Año | 2012 | |
| Editorial | Wiley | Edición | 1ª | |
| Tema | ISBN | 9781118230022 |
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Título | Language Of Mathematics, The Utilizing Math In Practice | Precio | $1507.00 |
| Autor | Laurence Baber, Robert | Año | 2011 | |
| Editorial | Wiley | Edición | 1ª | |
| Tema | ISBN | 9780470878897 |
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Título | Biochemistry | Precio | $1776.00 |
| Autor | Voet, Donald; Judith G. Voet | Año | 2011 | |
| Editorial | Wiley | Edición | 4ª | |
| Tema | ISBN | 9780470570951 |
|
Título | Elementary Differential Equations | Precio | $1480.00 |
| Autor | Boyce | Año | ||
| Editorial | Wiley | Edición | ||
| Tema | ISBN | 978470458327 |
Filtrar resultados
Autores
Aaker/ Kumar/ DayAdam AlexanderAdriaan Van Den BosAge Smilde, Rasmus Bro, Paul
GeladiAgostino, R. D': P. Favia; Y.
Kawai; H. Ikegami; N. Sato; AnAlex GringauzAllen, Edward Ans Joseph IanoAlphonse ChapanisAlspach TedAlspector MarcAndrés IllanesAngelescu SilviuArnér MagnusArons, ArnoldArthur GriffthAugustin, SallyAven, TerjeAxler, SheldonBadi H. BaltagiBahadori AlirezaBaird, Bruce F.Balanis, Constantine A.Banerjee, Soumitro; Verghese,
George C.Bard, Allen J/ Faulkner, Larry RBardi James A.Bauer, PeterBerry CicleyBhatti, M. AsgharBiermaBillingsley, PatrickBindner, Donald; Martin J.
Erickson; Joe HemmeterBird, R. B. Stewart, E. W.
Lightfoot, E. W.Bisgaard, Soren / Kulahci, MuratBob, Negen/ Susan, NegenBolch Gunter/ Greiner Stefan/ de
Meer Herman/ Trivedi KishBoyceBrandon D.Braude, Eric J. ; Bernstein,
Michael E.Brown Meta SBruno SericolaBryan M. HamByoung Kyu Choi, Donghun KangByrnes, DavidCenter For Chemical Process
SaftetyChalfie Martin/ Kain StevenCharles PetzoldChassaing, RulphChristian, Gary / Dasgupta,
Purnendu / Schug, KevinChristoph ElschenbroichChristopher NegusClark, Colin W.Cochran, William G.Cooker RogerCoolidge Frederick L/ Wynn ThomasCooper Alan/ Reimann Robert/
Cronin DavidCox DavidCrabtree, Robert H.Cramer Christopher JCuthbertsonDavies, John; Studer, Rudi;
Warren, Paul (Eds.)Declerck PhilippeDevlin Thomas MDhatt, Gouri; Gilbert Touzot;
Emmanuel LefrancoisDirk P. KroeseDonald T. Sawyer; William R. ,
Heineman; Janicem. BeebeEnders, WalterEpperson, James F.Epstein, Barry J. ; Ralph Nach;
Steven M. BraggErickson MartinEsty, Daniel C. ; Winston, Andrew
S.Exner, John E. ; Philip ErdbergFaticoni Theodore G.Faticoni, Theodore G.Felder Richard M/ Rousseau Ronald
W.Fenner RogerFester Kratz, Rene; Rae Siegfried,
DonnaFinkelstein Ellen/ Leete GurdyFinnerty J. D.Fredricks, Karen; Orenstein, LonFries, ChristianFske Susan T.Furlong C. JudithGareth ThomasGilat AmosGläser, Michael And Manfred
KochsiekGoldstein Alan MGolnaraghi, Farid; Benjamin C. KuoGorroochurn, PrakashGoswami, Jaideva C. ; Chan, Andrew
K.Grant, JohnGreenberg, Michael D.Grewal S. MochinderGroat Linda And Wand DavidGygi CraigHanrahan, Grady; Gomez, Frank A.
(Eds.)Haugen, PeterHecht JeffHenry Bouchet, Michel; Ephraim
Clark; Bertrand GroslambertHillen, T. ; I. E. Leonard; H. Van
RoesselHoffman PaulHolzner, Steven, PhdHuges-Hallett; Gleason; Lock;
FlathHugh Sebag-MontefioreIano JosephIrwin, William (Series Editor) ;
White D. ; Mark; Arp, RoberJ. Crawley, MichaelJ. David LoganJames F. EppersonJames Welty, Gregory L. Rorrer And
David G. FosterJensen FrankJones, Russell; Helen Ougham;
Howard Thomas; Susan WaalandJuvinall, Robert C. ; Marshek,
Kurt M.Katoh ShigeoKawai, Y. ; H. Ikegami; N. Sato;
A. Matsuda; K. Uchino; M. KuKeller, EricKennedy MichaelKieso WeygandtKittel, CharlesKlugman Stuart AKoller, Tim; Marc Goedhart; David
WesselsKuhn HansLahann JoergLaurence Baber, RobertLinder BrunoLoffler, Gunter; Posch, Peter N.Machin DavidMark T. MayburyMath H. BollenMcneil Brian/ Harvey LindaMeier, RetoMelnick, JeffreyMilsom John J.Montgomery, Douglas C.Morrison Ian D/ Ross SydneyMoulijn, Jacob A. ; Makkee,
Michiel; Van Diepen, AnneliesMwhNawin C. Mishra, Günter
BlobelNed MohanNicholson, Keith W.Odian GeorgePaschos, Vangelis Th. (Ed.)Pearlson, Keri E. ; Carol S.
SaundersPeckol, James K.Pender TomPerry GilPeter BloomfieldPoslad, StefanRamsey/ SleeperRebaza, JorgeRicard ReidRobin K. HarrisRodriguez, JoseRoesky W. HerbertRogers Donald W.Rolski, T. ; H. Schmidli; V.
Schmidt; J. TeugelsRothenberg, GadiRoy J. GlauberRyan, MichaelSaul StahlSchnoor Jerald LSchodek, Daniel; Martin Bechthold;
Kimo Griggs; Kenneth MartSchroder, Bernd S. W.Schroeder, Carol LScott RogersSeader; Henley; RoperSeber, G. A. F. ; Wild, C. J.Seber, George A. F.Seborg/ Edgar/ Mellichamp/ DoyleSilver, MikeSilverstein Robert/ Webster
Francis X/ Kiemle David JSilverstein, David; Philip Samuel;
Neil DecarloSimon, DanSmirnov, Boris M.Solomon, Edward / Lever, A. B. P.Solomons, Graham T. W. ; Craig B.
FryhleStahl SaulStahl Thomas/ Volter MarkusSteed Jonathan/ Atwood JerryStern Nancy/ Stern Robert A/ Ley
James PSung Nok ChiuSze S. M.Tamhane, Ajit C.Theodore L. Bergman, Adrienne S.
Lavine, Frank P. Incropera,Toshio Fuchigami, Mahito Atobe,
Shinsuke InagiTourlakis, GeorgeValeur, Bernard And Mario N.
Berberan-SantosVoet, Donald; Judith G. VoetVolkhard HelmsWakita Osamu/ Linde RichardWangler Thomas P.Webster John G.Weston M. StaceyWooldridge, MichaelXin-She YangYoung DavidZhou, Xiao-Hua; Obuchowski, Nancy
A. ; Mcclish, Donna K.Zomaya Albert Y
GeladiAgostino, R. D': P. Favia; Y.
Kawai; H. Ikegami; N. Sato; AnAlex GringauzAllen, Edward Ans Joseph IanoAlphonse ChapanisAlspach TedAlspector MarcAndrés IllanesAngelescu SilviuArnér MagnusArons, ArnoldArthur GriffthAugustin, SallyAven, TerjeAxler, SheldonBadi H. BaltagiBahadori AlirezaBaird, Bruce F.Balanis, Constantine A.Banerjee, Soumitro; Verghese,
George C.Bard, Allen J/ Faulkner, Larry RBardi James A.Bauer, PeterBerry CicleyBhatti, M. AsgharBiermaBillingsley, PatrickBindner, Donald; Martin J.
Erickson; Joe HemmeterBird, R. B. Stewart, E. W.
Lightfoot, E. W.Bisgaard, Soren / Kulahci, MuratBob, Negen/ Susan, NegenBolch Gunter/ Greiner Stefan/ de
Meer Herman/ Trivedi KishBoyceBrandon D.Braude, Eric J. ; Bernstein,
Michael E.Brown Meta SBruno SericolaBryan M. HamByoung Kyu Choi, Donghun KangByrnes, DavidCenter For Chemical Process
SaftetyChalfie Martin/ Kain StevenCharles PetzoldChassaing, RulphChristian, Gary / Dasgupta,
Purnendu / Schug, KevinChristoph ElschenbroichChristopher NegusClark, Colin W.Cochran, William G.Cooker RogerCoolidge Frederick L/ Wynn ThomasCooper Alan/ Reimann Robert/
Cronin DavidCox DavidCrabtree, Robert H.Cramer Christopher JCuthbertsonDavies, John; Studer, Rudi;
Warren, Paul (Eds.)Declerck PhilippeDevlin Thomas MDhatt, Gouri; Gilbert Touzot;
Emmanuel LefrancoisDirk P. KroeseDonald T. Sawyer; William R. ,
Heineman; Janicem. BeebeEnders, WalterEpperson, James F.Epstein, Barry J. ; Ralph Nach;
Steven M. BraggErickson MartinEsty, Daniel C. ; Winston, Andrew
S.Exner, John E. ; Philip ErdbergFaticoni Theodore G.Faticoni, Theodore G.Felder Richard M/ Rousseau Ronald
W.Fenner RogerFester Kratz, Rene; Rae Siegfried,
DonnaFinkelstein Ellen/ Leete GurdyFinnerty J. D.Fredricks, Karen; Orenstein, LonFries, ChristianFske Susan T.Furlong C. JudithGareth ThomasGilat AmosGläser, Michael And Manfred
KochsiekGoldstein Alan MGolnaraghi, Farid; Benjamin C. KuoGorroochurn, PrakashGoswami, Jaideva C. ; Chan, Andrew
K.Grant, JohnGreenberg, Michael D.Grewal S. MochinderGroat Linda And Wand DavidGygi CraigHanrahan, Grady; Gomez, Frank A.
(Eds.)Haugen, PeterHecht JeffHenry Bouchet, Michel; Ephraim
Clark; Bertrand GroslambertHillen, T. ; I. E. Leonard; H. Van
RoesselHoffman PaulHolzner, Steven, PhdHuges-Hallett; Gleason; Lock;
FlathHugh Sebag-MontefioreIano JosephIrwin, William (Series Editor) ;
White D. ; Mark; Arp, RoberJ. Crawley, MichaelJ. David LoganJames F. EppersonJames Welty, Gregory L. Rorrer And
David G. FosterJensen FrankJones, Russell; Helen Ougham;
Howard Thomas; Susan WaalandJuvinall, Robert C. ; Marshek,
Kurt M.Katoh ShigeoKawai, Y. ; H. Ikegami; N. Sato;
A. Matsuda; K. Uchino; M. KuKeller, EricKennedy MichaelKieso WeygandtKittel, CharlesKlugman Stuart AKoller, Tim; Marc Goedhart; David
WesselsKuhn HansLahann JoergLaurence Baber, RobertLinder BrunoLoffler, Gunter; Posch, Peter N.Machin DavidMark T. MayburyMath H. BollenMcneil Brian/ Harvey LindaMeier, RetoMelnick, JeffreyMilsom John J.Montgomery, Douglas C.Morrison Ian D/ Ross SydneyMoulijn, Jacob A. ; Makkee,
Michiel; Van Diepen, AnneliesMwhNawin C. Mishra, Günter
BlobelNed MohanNicholson, Keith W.Odian GeorgePaschos, Vangelis Th. (Ed.)Pearlson, Keri E. ; Carol S.
SaundersPeckol, James K.Pender TomPerry GilPeter BloomfieldPoslad, StefanRamsey/ SleeperRebaza, JorgeRicard ReidRobin K. HarrisRodriguez, JoseRoesky W. HerbertRogers Donald W.Rolski, T. ; H. Schmidli; V.
Schmidt; J. TeugelsRothenberg, GadiRoy J. GlauberRyan, MichaelSaul StahlSchnoor Jerald LSchodek, Daniel; Martin Bechthold;
Kimo Griggs; Kenneth MartSchroder, Bernd S. W.Schroeder, Carol LScott RogersSeader; Henley; RoperSeber, G. A. F. ; Wild, C. J.Seber, George A. F.Seborg/ Edgar/ Mellichamp/ DoyleSilver, MikeSilverstein Robert/ Webster
Francis X/ Kiemle David JSilverstein, David; Philip Samuel;
Neil DecarloSimon, DanSmirnov, Boris M.Solomon, Edward / Lever, A. B. P.Solomons, Graham T. W. ; Craig B.
FryhleStahl SaulStahl Thomas/ Volter MarkusSteed Jonathan/ Atwood JerryStern Nancy/ Stern Robert A/ Ley
James PSung Nok ChiuSze S. M.Tamhane, Ajit C.Theodore L. Bergman, Adrienne S.
Lavine, Frank P. Incropera,Toshio Fuchigami, Mahito Atobe,
Shinsuke InagiTourlakis, GeorgeValeur, Bernard And Mario N.
Berberan-SantosVoet, Donald; Judith G. VoetVolkhard HelmsWakita Osamu/ Linde RichardWangler Thomas P.Webster John G.Weston M. StaceyWooldridge, MichaelXin-She YangYoung DavidZhou, Xiao-Hua; Obuchowski, Nancy
A. ; Mcclish, Donna K.Zomaya Albert Y
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Última actualización: Jul 2019